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The linear array detector is an optional system component that enables fan-beam DR/CT functionality. Compared to area array detectors, it offers faster single-layer scanning speed and higher image quality.

Linear array detectors are further divided into straight-line and curved-line types, both of which can be equipped with collimators to enhance image quality. Straight-line detectors offer higher spatial resolution and measurement accuracy, while curved-line detectors provide better grayscale and density resolution, resulting in superior image quality.

The area array detector is the standard configuration for the entire system, enabling all basic DR/CT functionalities.

Within the same product series, the higher the energy of the X-ray source, the stronger its penetration capability, allowing for the inspection of thicker and denser workpieces.

The open transmission target microfocus X-ray source has low power and a small focal spot size, making it suitable for inspecting low-density, small-sized, and high-precision workpieces.

The open refraction target microfocus X-ray source has high power and a wide range of focal spot sizes, covering inspection needs for various sizes and precision levels.

A: It is not a direct equivalence, but there is a proportional relationship. For example, if you want to clearly see a feature structure of X μm in your sample, the device's resolution needs to be around X÷3 μm to successfully characterize it. Conversely, if the device can achieve a minimum resolution of Y μm for your sample, the imaging results can reveal feature structures of approximately 3*Y μm in size.

A: Both DR (Digital Radiography) and CT (Computed Tomography) use X-ray technology for imaging. DR produces 2D images, while CT builds on DR by capturing thousands of DR images around a rotating axis, which are then reconstructed into 3D images using software, providing more easily visualized and analyzed 3D internal data.

A: CT result data is in raw file format and can be opened using commercial software such as Avizo, Dragonfly, Vgstudio, and ImageJ. The data format is bit depth + length + width + height, for example, Slice16bitw1088h1088z2205, where the bit depth is 16bit, length is 1088, width is 1088, and height is 2205, with units in resolution size.

A: High-temperature environments can be achieved through contact and non-contact heating methods. The entire heating and scanning process is controlled by software, with the target temperature reached only at the marked segment, and vacuum atmosphere protection can be applied. Tests have shown that the temperature drops to ambient levels a few centimeters away from the sample, ensuring no safety issues.

A: Not exactly. Due to the efficiency limitations of X-ray scanning imaging (minimum 10+ minutes), in-situ CT does not observe internal structural changes in real-time. Instead, it maintains the state at selected operational stages, initiates X-ray scanning, and proceeds to the next stage after scanning is completed, until all selected stages are scanned.

A: While a 225kV CT device indeed has better penetration than a 160kV CT device, covering a wider density range, it also means the focal spot size of the X-ray source increases, resulting in lower ultimate resolution compared to lower tube voltage devices.

A: Yes, to ensure imaging quality, it is recommended to reduce the sample size. For example, for the same material, a 20mm sample can achieve a maximum resolution of 20μm, while a 5mm sample can achieve 5μm. However, for high-density samples (e.g., density > 8), which exceed penetration capabilities, even small sizes may not guarantee good imaging results.

A: X-ray CT is based on penetration imaging. With constant tube voltage, higher sample density makes penetration more difficult, resulting in poorer imaging quality. For a given sample density, smaller samples yield higher resolution.

A: The achievable resolution depends on a combination of sample density, sample size, scanning time, and device capabilities. Achieving the maximum resolution also implies extreme sample density, extreme sample size, and the longest scanning time, so a balanced approach is recommended.